Simulation of a lateral scanning white-light interferometer
Rising demands for the surface quality of consumer and industrial products require fast and accurate metrology. White-light interferometry (WLI) is an established measurement method for topography on optically smooth surfaces. The advantages of WLI can be used in in-process applications as well, when applying lateral scanning WLI (LSWLI), as first described by Olszak. To date, LSWLI has primarily been used for plane surfaces.
While measuring on surfaces with a low curvature (r > 100 mm) is not much different than measuring on plane surfaces, higher curvatures can cause detrimental optical and geometrical effects on the measurement. The influe nce ofcurvature on LSWLI are currently under investigation.
As part of a federally funded project, a simulation of the LSWLI-system is to be programmed to complement laboratory experiments. This assignment focusses on the signal behaviour, when applying LSWLI on curved surfaces.
- Student enrolled in MINT subject
- Strong interest in programming
- Creativity and independent working method